MM-BD: Post-Training Detection of Backdoor Attacks with Arbitrary Backdoor Pattern Types Using a Maximum Margin Statistic

Abstract

Backdoor attacks are an important type of adversarial threat against deep neural network classifiers, wherein test samples from one or more source classes will be (mis)classified to the attacker’s target class when a backdoor pattern is embedded. In this paper, we focus on the post-training backdoor defense scenario commonly considered in the literature, where the defender aims to detect whether a trained classifier was backdoor-attacked without any access to the training set. Many post-training detectors are designed to detect attacks that use either one or a few specific backdoor embedding functions (e.g., patch-replacement or additive attacks). These detectors may fail when the backdoor embedding function used by the attacker (unknown to the defender) is different from the backdoor embedding function assumed by the defender. In contrast, we propose a post-training defense that detects backdoor attacks with arbitrary types of backdoor embeddings, without making any assumptions about the backdoor embedding type. Our detector leverages the influence of the backdoor attack, independent of the backdoor embedding mechanism, on the landscape of the classifier’s outputs prior to the softmax layer. For each class, a maximum margin statistic is estimated. Detection inference is then performed by applying an unsupervised anomaly detector to these statistics. Thus, our detector does not need any legitimate clean samples, and can efficiently detect backdoor attacks with arbitrary numbers of source classes. These advantages over several state-of-the-art methods are demonstrated on four datasets, for three different types of backdoor patterns, and for a variety of attack configurations. Finally, we propose a novel, general approach for backdoor mitigation once a detection is made. The mitigation approach was the runner-up at the first IEEE Trojan Removal Competition. The code is online available.